| Article Details : |
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| | | Article Name : | | | Study of TiO2 thin films growth on ITO substrate by
electrodeposition using atomic force microscopy | | Author Name : | | | MOISÉS DO AMARAL AMÂNCIO
, YONNY ROMAGUERA-BARCELAY, FRANCISCO XAVIER NOBRE, WALTER RICARDO BRITO, HENRIQUE DUARTE DA FONSECA FILHO1 | | Publisher : | | | Bridge Center | | Article URL : |  | | | Abstract : | | | The use of thin films for the development of high-performance
solar panels has been widely studied. In this study, ITO substrate
(glass coated with Indium Tin Oxide) was coated with TiO2
nanoparticles by electrodeposition processes. AFM technique was used
to study the morphology, thickness, and surface roughness. Five films
were produced for different deposition times. The films morphology
was affected by the deposition time. The thickness increased as a
function of the deposition time. The roughness decreased considerably
when the deposition time increased. The coatings were considered
uniform and homogeneous. These results were presented as an
optimization of the TiO2/ITO system that can enhance the application
of these films in the technological field.
| | Keywords : | | | TiO2, ITO, Roughness, Electrodeposition, Morphology |
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